PUBLICATION: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

AUTHORS: Wang, Y; Li, B

 

Multilayer structures (MS) have been widely used as coating materials in the X-ray regime to enhance reflectivity. Based on Parratt?s exact recursive method, a Fourier analysis algorithm including both Fast Fourier transform (FFT) and inverse fast Fourier transform (IFFT) was utilized to investigate the mutual interaction between a single-spike hard X-ray attosecond pulse and W/B4C MS with interfacial roughness. Moreover, an analytic model was developed to investigate the reflection of linear-chirp attosecond pulses from MS and the changes of the reflected pulses with respect to the incident ones. Our results showed that the reflected attosecond pulses are modified by the proposed broadband MS slightly, maintaining their original pulse lengths and phase profiles, thereby confirming the feasibility of linear-chirp approximation.

 

LINKS: http://dx.doi.org/10.1016/j.nima.2021.165233